UFC 3-570-06
JANUARY 31 2003
Table 4-1. Close-Interval Survey CP System Component Testing Requirements
CP SYSTEM TYPE
TEST MEASUREMENT
GALVANIC
a) One anode-to-soil potential measurement with the reference
(SACRIFICIAL)
electrode placed over the anode, and the anode lead
SYSTEMS (at each test
disconnected.
station)
b) Anode-to-structure current using (in order of preference) a
clamp-on milliammeter, a multimeter measuring millivolts across a
calibrated shunt, or a multimeter connected in series measuring
milliamperes.
IMPRESSED CURRENT a) Perform the rectifier operational checkout (para 4-5).
SYSTEMS
b) Calculate the rectifier efficiency by dividing the calculated output
DC power by the factored input AC power.
c) Perform the impressed current anode bed survey (para 4-6).
4-2
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